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[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - A 1/4 inch 380 k pixel IT-CCD image sensor employing gate-assisted punchthrough read-out mode
Mutoh, N., Orihara, K., Kawakami, Y., Nakano, T., Kawai, S., Murakami, I., Tanabe, A., Suwazono, S., Arai, K., Teranishi, N., Furumiya, M., Morimoto, M., Hatano, K., Minami, K., Hokari, Y.Year:
1993
Language:
english
DOI:
10.1109/iedm.1993.347287
File:
PDF, 339 KB
english, 1993