[IEEE 2012 7th IEEE Conference on Industrial Electronics...

  • Main
  • [IEEE 2012 7th IEEE Conference on...

[IEEE 2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Singapore, Singapore (2012.07.18-2012.07.20)] 2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA) - A framework for measurement and analysis of surface defects on sphere parts

Zhou, Awei, Guo, Junjie, Li, Beizhan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/iciea.2012.6361082
File:
PDF, 246 KB
english, 2012
Conversion to is in progress
Conversion to is failed