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[IEEE 2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Singapore, Singapore (2012.07.18-2012.07.20)] 2012 7th IEEE Conference on Industrial Electronics and Applications (ICIEA) - A framework for measurement and analysis of surface defects on sphere parts
Zhou, Awei, Guo, Junjie, Li, BeizhanYear:
2012
Language:
english
DOI:
10.1109/iciea.2012.6361082
File:
PDF, 246 KB
english, 2012