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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue
Po-Ying Chen,, Chwei-Shyong Tsai,, Ming-Hsiung Tsai,, Heng-Yu Kung,, Shen-Li Chen,, Jing, M. H., Wen-Kuan Yeh,Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734761
File:
PDF, 3.47 MB
english, 2008