Variable I–V characteristics method applied to model the...

Variable I–V characteristics method applied to model the electrical behavior of an irradiated P–N junction. Extension to the junction in an irradiated transistor

Sudre, C., Pelanchon, F.
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Volume:
138
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159608211505
Date:
January, 1996
File:
PDF, 408 KB
english, 1996
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