[IEEE 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm 2011) - Minneapolis, MN, USA (2011.09.11-2011.09.14)] 2011 IEEE 57th Holm Conference on Electrical Contacts (Holm) - Degradation Phenomena of Electrical Contacts Using Hammering Oscillating Mechanism and Micro-Sliding Mechanism- Contact Resistance and Its Model
Wada, Shin-ichi, Sawa, KoichiroYear:
2011
Language:
english
DOI:
10.1109/holm.2011.6034821
File:
PDF, 4.13 MB
english, 2011