A critical study of defect migration and ferroelectric...

Integrated Ferroelectrics 1997 / 09 Vol. 18; Iss. 1-4

A critical study of defect migration and ferroelectric fatigue in lead zirconate titanate thin film capacitors under extreme temperatures

Paton, Eric, Brazier, Mark, Mansour, Said, Bement, Arden
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Volume:
18
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589708221683
Date:
September, 1997
File:
PDF, 486 KB
english, 1997
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