[IEEE 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel (IEEEI) - Eilat, Israel (2008.12.3-2008.12.5)] 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel - Gaussian beam summation analysis of half plane diffraction: A full 3D formulation
Katsav, M., Heyman, E.Year:
2008
Language:
english
DOI:
10.1109/eeei.2008.4736712
File:
PDF, 1.37 MB
english, 2008