[IEEE 2006 Canadian Conference on Electrical and Computer Engineering - Ottawa, ON, Canada (2006.05.7-2006.05.10)] 2006 Canadian Conference on Electrical and Computer Engineering - Testing Activities for KT-OSS Development
Kim, Dae-woo, Lim, Hyun-min, Lee, Sang-konYear:
2006
Language:
english
DOI:
10.1109/ccece.2006.277822
File:
PDF, 4.78 MB
english, 2006