Discovering patterns of achievement in Hong Kong students:...

Discovering patterns of achievement in Hong Kong students: An application of the Rasch measurement model

Phillipson, Shane N., Tse, Andy Ka‐on
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Volume:
18
Language:
english
Journal:
High Ability Studies
DOI:
10.1080/13598130701709640
Date:
December, 2007
File:
PDF, 530 KB
english, 2007
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