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[IEEE 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008 - Seattle, WA, USA (2008.05.18-2008.05.21)] 2008 IEEE International Symposium on Circuits and Systems - Don’t care filling for power minimization in VLSI circuit testing
Maiti, Tapas Kr., Chattopadhyay, SantanuYear:
2008
Language:
english
DOI:
10.1109/iscas.2008.4541998
File:
PDF, 99 KB
english, 2008