![](/img/cover-not-exists.png)
[IRE 1982 International Electron Devices Meeting - ()] 1982 International Electron Devices Meeting - Characterization of CMOS latch-up
Huang, C.C., Hartranft, M.D., Pu, N.F., Yue, C., Rahn, C., Schrankler, J., Kirchner, G.D., Hampton, F.L., Hendrickson, T.E.Year:
1982
Language:
english
DOI:
10.1109/iedm.1982.190323
File:
PDF, 1.08 MB
english, 1982