[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - Method of Creating Database for Test System Based on MCU
Buyue, Chen, Yinkun, Wang, Jin, ZhangYear:
2007
Language:
english
DOI:
10.1109/icemi.2007.4350905
File:
PDF, 488 KB
english, 2007