A Complete Characterization and Modeling of the BTI-Induced...

IEEE Transactions on Electron Devices 2014 / 12 Vol. 61; Iss. 12

A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology

El Husseini, Joanna, Garros, Xavier, Cluzel, Jacques, Subirats, Alexandre, Makosiej, Adam, Weber, Olivier, Thomas, Olivier, Huard, Vincent, Federspiel, Xavier, Reimbold, Gilles
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2014.2361954
Date:
December, 2014
File:
PDF, 4.44 MB
english, 2014
Conversion to is in progress
Conversion to is failed