Research on Eit Boundary Measured Voltage Data Denoising...

Research on Eit Boundary Measured Voltage Data Denoising Based on a Subspace Method

Chang, Tiantian, Dai, Meng, Xu, Canhua, Fu, Feng, You, Fusheng, Dong, Xiuzhen
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Volume:
27
Language:
english
Journal:
Biotechnology & Biotechnological Equipment
DOI:
10.5504/BBEQ.2013.0084
Date:
January, 2013
File:
PDF, 5.89 MB
english, 2013
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