Ultrafast Dynamics of Defect-Assisted Electron–Hole...

Nano Letters 2015 / 01 Vol. 15; Iss. 1

Ultrafast Dynamics of Defect-Assisted Electron–Hole Recombination in Monolayer MoS 2

Wang, Haining, Zhang, Changjian, Rana, Farhan
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Volume:
15
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl503636c
Date:
January, 2015
File:
PDF, 1.51 MB
english, 2015
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