[IEEE 2012 4th Asia Symposium on Quality Electronic Design (ASQED 2012) - Penang, Malaysia (2012.07.10-2012.07.11)] 2012 4th Asia Symposium on Quality Electronic Design (ASQED) - Soft-error hardened redundant triggered latch
Alidash, Hossein Karimiyan, Sayedi, Sayed Masoud, Oklobdzija, Vojin G.Year:
2012
Language:
english
DOI:
10.1109/acqed.2012.6320514
File:
PDF, 370 KB
english, 2012