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[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Fast electrostatic diagnostic of an electron beam in a Penning-Malmberg trap
Bettega, Giovanni, Paroli, Bruno, Rome, Massimiliano, Norgia, Michele, Pesatori, Alessandro, Svelto, CesareYear:
2009
Language:
english
DOI:
10.1109/imtc.2009.5168627
File:
PDF, 479 KB
english, 2009