[IEEE 2012 24th International Conference on Microelectronics (ICM) - Algiers, Algeria (2012.12.16-2012.12.20)] 2012 24th International Conference on Microelectronics (ICM) - A new eye on NBTI-induced traps up to device lifetime using on the fly oxide trap method
Djezzar, Boualem, Tahi, Hakim, Benabdelmoumene, Abdelmadjid, Chenouf, AmelYear:
2012
Language:
english
DOI:
10.1109/icm.2012.6471422
File:
PDF, 275 KB
english, 2012