Non-parametric Bayesian modeling of hazard rate with a change point for nanoelectronic devices
Yang, Chia-Han, Yuan, Tao, Kuo, Way, Kuo, YueVolume:
44
Language:
english
Journal:
IIE Transactions
DOI:
10.1080/0740817X.2011.587864
Date:
July, 2012
File:
PDF, 292 KB
english, 2012