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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Morphological analysis of GaN membranes obtained by micromachining of GaN/Si
Cismaru, A., Muller, A., Comanescu, F., Purica, M., Stefanescu, A., Dinescu, A., Konstantinidis, G., Stavrinidis, A.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6532090
File:
PDF, 879 KB
english, 2013