[IEEE 2008 3rd International Design and Test Workshop (IDT)...

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[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Session B4: System-on-chip

Dekeyser, Jean-Luc, Obeid, Abdulfattah Mohammad
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Year:
2008
DOI:
10.1109/idt.2008.4802496
File:
PDF, 95 KB
2008
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