[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Session B4: System-on-chip
Dekeyser, Jean-Luc, Obeid, Abdulfattah MohammadYear:
2008
DOI:
10.1109/idt.2008.4802496
File:
PDF, 95 KB
2008