[IEEE 25th International Reliability Physics Symposium -...

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[IEEE 25th International Reliability Physics Symposium - San Diego, CA, USA (1987.04.7-1987.04.9)] 25th International Reliability Physics Symposium - ESD Phenomena and Protection Issues in CMOS Output Buffers

Duvvury, C., Rountree, R.N., Fong, Y., McPhee, R.A.
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Year:
1987
Language:
english
DOI:
10.1109/irps.1987.362175
File:
PDF, 8.16 MB
english, 1987
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