TEM Observation of Dark Defects Appearing in InGaAsP/InP Double-Heterostructure Light Emitting Diodes Aged at High Temperature
Ueda, Osamu, Komiya, Satoshi, Yamakoshi, Shigenobu, Kotani, TsuyoshiVolume:
20
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.20.1201
Date:
July, 1981
File:
PDF, 3.49 MB
1981