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Electron transport and magnetic penetration depth in niobium-silicon multilayers
Sherrill, G.K., Cukauskas, E.J., Allen, L.H.Volume:
3
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.233902
Date:
March, 1993
File:
PDF, 446 KB
english, 1993