Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization ((In 2 Volumes)) || TIME-DOMAIN THERMOREFLECTANCE MEASUREMENTS FOR THERMAL PROPERTY CHARACTERIZATION OF NANOSTRUCTURES
Haight, Richard, Ross, Frances M, Hannon, James BVolume:
10.1142/78
Year:
2011
Language:
english
DOI:
10.1142/9789814322843_0013
File:
PDF, 340 KB
english, 2011