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[IEEE 1991, International Test Conference - Nashville, TN (Oct. 26-30 1991)] 1991, Proceedings. International Test Conference - Hierarchical Test Program Development for Scan Testable Circuits
Leenstra, J., Spaanenburg, L.Year:
1991
Language:
english
DOI:
10.1109/test.1991.519697
File:
PDF, 1.12 MB
english, 1991