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[IEEE 12th International Reliability Physics Symposium - Las Vegas, NV, USA (1974.04.2-1974.04.4)] 12th International Reliability Physics Symposium - Reliability of Silicon and Gallium Arsenide KA-Band Impatt Diodes
Staecker, P., Lindley, W. T., Murphy, R. A., Donnelly, J. P.Year:
1974
Language:
english
DOI:
10.1109/irps.1974.362660
File:
PDF, 6.11 MB
english, 1974