[IEEE 2007 IEEE Autotestcon - Baltimore, MD, USA (2007.09.17-2007.09.20)] 2007 IEEE Autotestcon - Integrating the LXI standard into a scalable microwave interface platform
Sarfi, TomYear:
2007
Language:
english
DOI:
10.1109/autest.2007.4374259
File:
PDF, 909 KB
english, 2007