[IEEE 2011 6th IEEE Conference on Industrial Electronics...

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[IEEE 2011 6th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Beijing, China (2011.06.21-2011.06.23)] 2011 6th IEEE Conference on Industrial Electronics and Applications - Research on the EFT radiation characteristic of classical structures used in Measuring-control System

Liu, Chao, Wang, Lixin, Zhao, Dan, Luo, Weilin
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Year:
2011
Language:
english
DOI:
10.1109/iciea.2011.5975723
File:
PDF, 823 KB
english, 2011
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