[IEEE 2011 6th IEEE Conference on Industrial Electronics and Applications (ICIEA) - Beijing, China (2011.06.21-2011.06.23)] 2011 6th IEEE Conference on Industrial Electronics and Applications - Research on the EFT radiation characteristic of classical structures used in Measuring-control System
Liu, Chao, Wang, Lixin, Zhao, Dan, Luo, WeilinYear:
2011
Language:
english
DOI:
10.1109/iciea.2011.5975723
File:
PDF, 823 KB
english, 2011