[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - Cathodo- and electro- luminescences image mapping technique to study traps in GaN-based LEDs
Euyhwan Park,, Garam Kim,, Janghyun Kim,, Donghoon Kang,, Joong-Kon Son,, Byung-Gook Park,Year:
2012
Language:
english
DOI:
10.1109/nano.2012.6321929
File:
PDF, 1.09 MB
english, 2012