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[IEEE 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Glasgow, United Kingdom (2013.09.3-2013.09.5)] 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Technology CAD challenges of modeling multi-gate transistors

Weber, Cory, Basu, Dipanjan, Kotlyar, Roza, Morarka, Saurabh
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Year:
2013
Language:
english
DOI:
10.1109/sispad.2013.6650588
File:
PDF, 741 KB
english, 2013
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