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[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - A SAT-based diagnosis pattern generation method for timing faults in scan chains
Wang, Da, Zhang, Lunkai, Xu, Weizhi, Fan, Dongrui, Wang, FeiYear:
2012
Language:
english
DOI:
10.1109/iscas.2012.6271756
File:
PDF, 462 KB
english, 2012