Application of time of flight secondary ion mass...

Forensic Science International 2009 Vol. 193; Iss. 1-3

Application of time of flight secondary ion mass spectrometry to the in situ analysis of ballpoint pen inks on paper

John Coumbaros, K. Paul Kirkbride, Gunter Klass, William Skinner
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Volume:
193
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.forsciint.2009.08.020
File:
PDF, 235 KB
english, 2009
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