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Temperature calibration procedure for thin film substrates for thermo-ellipsometric analysis using melting point standards
Kappert, Emiel J., Raaijmakers, Michiel J.T., Ogieglo, Wojciech, Nijmeijer, Arian, Huiskes, Cindy, Benes, Nieck E.Volume:
601
Language:
english
Journal:
Thermochimica Acta
DOI:
10.1016/j.tca.2014.12.017
Date:
February, 2015
File:
PDF, 766 KB
english, 2015