Crosstalk noise modeling of multiwall carbon nanotube...

Microelectronics Reliability 2015 / 01 Vol. 55; Iss. 1

Crosstalk noise modeling of multiwall carbon nanotube (MWCNT) interconnects using finite-difference time-domain (FDTD) technique

Ramesh Kumar, Vobulapuram, Kaushik, Brajesh Kumar, Patnaik, Amalendu
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.09.001
Date:
January, 2015
File:
PDF, 1.11 MB
english, 2015
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