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Discuss the structure condition and sampling condition of wavelet transform profilometry
Chen, Wenjing, Sun, Juan, Su, Xianyu, Bian, XintianVolume:
54
Language:
english
Journal:
Journal of Modern Optics
DOI:
10.1080/09500340701219426
Date:
December, 2007
File:
PDF, 1.74 MB
english, 2007