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[IEEE 2010 IEEE Vehicular Technology Conference (VTC 2010-Fall) - Ottawa, ON, Canada (2010.09.6-2010.09.9)] 2010 IEEE 72nd Vehicular Technology Conference - Fall - Enhanced Lee Model from Rough Terrain Sampling Data Aspect
Lee, David J. Y., Fellow, William C. Y. LeeYear:
2010
Language:
english
DOI:
10.1109/vetecf.2010.5594119
File:
PDF, 474 KB
english, 2010