[IEEE 2006 IEEE Compound Semiconductor Integrated Circuit...

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[IEEE 2006 IEEE Compound Semiconductor Integrated Circuit Symposium - San Antonio, TX, USA (2006.11.12-2006.11.15)] 2006 IEEE Compound Semiconductor Integrated Circuit Symposium - Reliability Study of InGaP/GaAs HBT for 28V Operation

Chau, Frank, Lin, Barry, Chen, Yan, Kretschmar, Mark, Lee, Chien-ping, Wang, Nan-lei, Sun, Xiaopeng, Ma, Wenlong, Xu, Sarah, Hu, Peter
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Year:
2006
Language:
english
DOI:
10.1109/csics.2006.319960
File:
PDF, 3.97 MB
english, 2006
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