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An advanced area scaling approach for semiconductor burn-in
Kurz, Daniel, Lewitschnig, Horst, Pilz, JürgenVolume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.09.007
Date:
January, 2015
File:
PDF, 503 KB
english, 2015