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[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - The resilience wall: Cross-layer solution strategies
Mitra, Subhasish, Bose, Pradip, Cheng, Eric, Cher, Chen-Yong, Cho, Hyungmin, Joshi, Rajiv, Kim, Young Moon, Lefurgy, Charles R., Li, Yanjing, Rodbell, Kenneth P., Skadron, Kevin, Stathis, James, SzafaYear:
2014
Language:
english
DOI:
10.1109/vlsi-dat.2014.6834933
File:
PDF, 25.24 MB
english, 2014