[IEEE 2014 International Symposium on VLSI Design,...

  • Main
  • [IEEE 2014 International Symposium on...

[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - The resilience wall: Cross-layer solution strategies

Mitra, Subhasish, Bose, Pradip, Cheng, Eric, Cher, Chen-Yong, Cho, Hyungmin, Joshi, Rajiv, Kim, Young Moon, Lefurgy, Charles R., Li, Yanjing, Rodbell, Kenneth P., Skadron, Kevin, Stathis, James, Szafa
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2014
Language:
english
DOI:
10.1109/vlsi-dat.2014.6834933
File:
PDF, 25.24 MB
english, 2014
Conversion to is in progress
Conversion to is failed