Scanning force microscopy of heavy-ion tracks

Radiation Effects and Defects in Solids 1993 / 3 Vol. 126; Iss. 1

Scanning force microscopy of heavy-ion tracks

Ackermann, J., Grafström, S., Neitzert, M., Neumann, R., Trautmann, C., Vetter, J., Angert, N.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
126
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159308219711
Date:
March, 1993
File:
PDF, 660 KB
english, 1993
Conversion to is in progress
Conversion to is failed