Heavy-ion induced damage of binary semiconductors GaP and PbS
Karamian, S. A., Bugrov, V. N., Ascheron, C., Otto, G., Platonov, S. Yu., Yuminov, O. A.Volume:
126
Language:
english
Journal:
Radiation Effects and Defects in Solids
DOI:
10.1080/10420159308219723
Date:
March, 1993
File:
PDF, 621 KB
english, 1993