Structure Analysis of Oval Defect on Molecular Beam Epitaxial GaAs Layer by Cross-Sectional Transmission Electron Microscopy Observation
Kakibayashi, Hiroshi, Nagata, Fumio, Katayama, Yoshifumi, Shiraki, YasuhiroVolume:
23
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.23.L846
Date:
November, 1984
File:
PDF, 1.42 MB
1984