A New Method for the Characterization of Traps in...

A New Method for the Characterization of Traps in Luminescent Materials

Nakazawa, Eiichiro
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Volume:
23
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.23.L755
Date:
September, 1984
File:
PDF, 459 KB
1984
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