Characterisation of Stoichiometry in GaAs by X-Ray...

Characterisation of Stoichiometry in GaAs by X-Ray Intensity Measurements of Quasi-Forbidden Reflections

Fujimoto, Isao
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Volume:
23
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.23.l287
Date:
May, 1984
File:
PDF, 487 KB
1984
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