Structural Evaluation of GaAs/AlGaAs Heterointerfaces by...

Japanese Journal of Applied Physics 1984 / 5 Vol. 23; Iss. Part 2, No

Structural Evaluation of GaAs/AlGaAs Heterointerfaces by Atomic-Resolution Electron Micrograph with Clear Contrast

Furuta, Tomofumi, Sakaki, Hiroyuki, Ichinose, Hideki, Ishida, Yoichi, Sone, Mitsuo, Onoe, Morio
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Volume:
23
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.23.l265
Date:
May, 1984
File:
PDF, 817 KB
1984
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