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[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Visible Entropy: A Measure for Image Visibility
Hou, Zujun, Yau, Wei-YunYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.1080
File:
PDF, 565 KB
english, 2010