Time-Resolved X-ray Diffraction Measurements of...

Time-Resolved X-ray Diffraction Measurements of High-Density InAs Quantum Dots on Sb/GaAs Layers and the Suppression of Coalescence by Sb-Irradiated Growth Interruption

Kakuda, Naoki, Kaizu, Toshiyuki, Takahasi, Masamitu, Fujikawa, Seiji, Yamaguchi, Koichi
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Volume:
49
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.49.095602
Date:
September, 2010
File:
PDF, 237 KB
english, 2010
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