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[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Investigation of problems in JEDEC HBM ESD test standard

Huo, Mingxu, Han, Yan, Liu, Qi, Song, Bo, Ma, Qingrong, Zhu, Kehan, Shen, Yehui, Du, Xiaoyang, Dong, Shurong
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Year:
2008
Language:
english
DOI:
10.1109/edssc.2008.4760646
File:
PDF, 735 KB
english, 2008
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