[IEEE 2008 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, China (2008.12.8-2008.12.10)] 2008 IEEE International Conference on Electron Devices and Solid-State Circuits - Investigation of problems in JEDEC HBM ESD test standard
Huo, Mingxu, Han, Yan, Liu, Qi, Song, Bo, Ma, Qingrong, Zhu, Kehan, Shen, Yehui, Du, Xiaoyang, Dong, ShurongYear:
2008
Language:
english
DOI:
10.1109/edssc.2008.4760646
File:
PDF, 735 KB
english, 2008