X-Ray Topography Examination of Lattice Distortions in...

Japanese Journal of Applied Physics 1985 / 12 Vol. 24; Iss. Part 2, No

X-Ray Topography Examination of Lattice Distortions in LEC-Grown GaAs Single Crystals

Kitano, Tomohisa, Matsui, Junji, Ishikawa, Tetsuya
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Volume:
24
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.24.L948
Date:
December, 1985
File:
PDF, 736 KB
1985
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